JIA Wen-dou, FAN Chun-li, SUN Feng-rui, YANG Li. A Comparative Study on Thermal Excitations of Thermographic Defect Inspection and IdentificationJ. Infrared Technology , 2014, (10): 849-855.
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Citation:
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JIA Wen-dou, FAN Chun-li, SUN Feng-rui, YANG Li. A Comparative Study on Thermal Excitations of Thermographic Defect Inspection and IdentificationJ. Infrared Technology , 2014, (10): 849-855.
|
JIA Wen-dou, FAN Chun-li, SUN Feng-rui, YANG Li. A Comparative Study on Thermal Excitations of Thermographic Defect Inspection and IdentificationJ. Infrared Technology , 2014, (10): 849-855.
|
Citation:
|
JIA Wen-dou, FAN Chun-li, SUN Feng-rui, YANG Li. A Comparative Study on Thermal Excitations of Thermographic Defect Inspection and IdentificationJ. Infrared Technology , 2014, (10): 849-855.
|
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